Conference proceeding
Functional and partially-functional skewed-load tests
2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC), pp.505-510
01/2010
DOI: 10.1109/ASPDAC.2010.5419832
Abstract
Functional broadside tests were defined to address overtesting that may occur with unrestricted scan-based tests. However, the fault coverage achievable by functional broadside tests is lower than the fault coverage achievable by unrestricted scan-based tests. It was observed that skewed-load tests can improve the fault coverage achievable by unrestricted broadside tests. Motivated by these observations, we define functional (and partially-functional) skewed-load tests to improve the fault coverage of functional broadside tests while attempting to curb overtesting. We present experimental results to demonstrate the ability of functional skewed-load tests to improve the fault coverage without exceeding the maximum switching activity of functional broadside tests (which is one indication of potential overtesting).
Details
- Title: Subtitle
- Functional and partially-functional skewed-load tests
- Creators
- I Pomeranz - Purdue University West LafayetteS.M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 2010 15th Asia and South Pacific Design Automation Conference (ASP-DAC), pp.505-510
- Publisher
- IEEE
- DOI
- 10.1109/ASPDAC.2010.5419832
- ISSN
- 2153-6961
- eISSN
- 2153-697X
- Language
- English
- Date published
- 01/2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197283502771
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