Conference proceeding
Functional test of small-delay faults using SAT and Craig interpolation
2012 IEEE International Test Conference, pp.1-8
11/2012
DOI: 10.1109/TEST.2012.6401550
Abstract
We present SATSEQ, a timing-aware ATPG system for small-delay faults in non-scan circuits. The tool identifies the longest paths suitable for functional fault propagation and generates the shortest possible sub-sequences per fault. Based on advanced model-checking techniques, SATSEQ provides detection of small-delay faults through the longest functional paths. All test sequences start at the circuit's initial state; therefore, overtesting is avoided. Moreover, potential invalidation of the fault detection is taken into account. Experimental results show high detection and better performance than scan testing in terms of test application time and overtesting-avoidance.
Details
- Title: Subtitle
- Functional test of small-delay faults using SAT and Craig interpolation
- Creators
- Matthias Sauer - University of FreiburgStefan Kupferschmid - University of FreiburgAlexander Czutro - University of FreiburgIlia Polian - University of PassauSudhakar Reddy - University of IowaBernd Becker - University of Freiburg
- Resource Type
- Conference proceeding
- Publication Details
- 2012 IEEE International Test Conference, pp.1-8
- Publisher
- IEEE
- DOI
- 10.1109/TEST.2012.6401550
- ISSN
- 1089-3539
- eISSN
- 2378-2250
- Language
- English
- Date published
- 11/2012
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197539202771
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