Generalization of independent faults for transition faults

I Pomeranz; S.M Reddy

doi:10.1109/VTEST.1992.232716

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Conference proceeding

Generalization of independent faults for transition faults

I Pomeranz and S.M Reddy

Digest of Papers. 1992 IEEE VLSI Test Symposium, Vol.1992-, pp.7-12

1992

DOI: 10.1109/VTEST.1992.232716

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Abstract

Independent faults were shown to he effective in computing small test sets for stuck-at faults. An efficient procedure for computing a maximal set of independent stuck-at faults is proposed. The notion of independent faults is then extended to other fault models, specifically, transition faults, that require two-pattern tests. Experimental results are presented to show that the computation of independent faults can be practically performed.< >

Circuit faults

Circuit testing

Cities and towns

Contracts

Delay

FETs

Polynomials

Semiconductor device modeling

System testing

Test pattern generators

Details

Title: Subtitle: Generalization of independent faults for transition faults
Creators: I Pomeranz - University of Iowa
S.M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Digest of Papers. 1992 IEEE VLSI Test Symposium, Vol.1992-, pp.7-12
DOI: 10.1109/VTEST.1992.232716
Publisher: IEEE
Language: English
Date published: 1992
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197357802771

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