Conference proceeding
Generation of Broadside Transition Fault Test Sets that Detect Four-Way Bridging Faults
Proceedings of the Design Automation & Test in Europe Conference, Vol.1, pp.1-6
2006
DOI: 10.1109/DATE.2006.243806
Abstract
Generation of n-detection test sets is typically done for a single fault model. In this work we investigate the generation of n-detection test sets by pairing each fault of a target fault model with n faults of a different fault model. Tests are generated such that they detect both faults of a pair. To facilitate test generation, we ensure that the faults included in a single pair have overlapping requirements for their detection. The advantage of this approach is that it ensures the detection of additional faults that would not be targeted during n-detection test generation for a single fault model. Experimental results with transition faults as the first fault model and four-way bridging faults as the second fault model are presented
Details
- Title: Subtitle
- Generation of Broadside Transition Fault Test Sets that Detect Four-Way Bridging Faults
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the Design Automation & Test in Europe Conference, Vol.1, pp.1-6
- DOI
- 10.1109/DATE.2006.243806
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Publisher
- IEEE
- Language
- English
- Date published
- 2006
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197065402771
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