Conference proceeding
Hyperactive Faults Dictionary to Increase Diagnosis Throughput
2008 17th Asian Test Symposium, pp.173-178
11/2008
DOI: 10.1109/ATS.2008.16
Abstract
For volume production of VLSI designs in future technologies fast and accurate diagnosis of manufacturing defects on a large number of chips is necessary to ramp up yields. Methods to speed up commonly used effect-cause fault diagnosis procedures have been recently proposed. These include the use of fault response dictionary. However, for very large industrial designs, these methods either need very large dictionaries or they drastically reduce the speedup achievable by using dictionaries. In this work we propose a method to achieve higher speedup with small sized dictionaries. We achieve this by identifying a set of faults called hyperactive faults for which we create a novel dictionary. Experimental results are presented to demonstrate the effectiveness of the proposed method.
Details
- Title: Subtitle
- Hyperactive Faults Dictionary to Increase Diagnosis Throughput
- Creators
- Chen Liu - University of IowaWu-Tung Cheng - Mentor GraphicsHuaxing Tang - Mentor GraphicsS.M Reddy - University of IowaWei Zou - Mentor GraphicsM Sharma - Mentor Graphics
- Resource Type
- Conference proceeding
- Publication Details
- 2008 17th Asian Test Symposium, pp.173-178
- DOI
- 10.1109/ATS.2008.16
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Publisher
- IEEE
- Language
- English
- Date published
- 11/2008
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197287302771
Metrics
111 Record Views