Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions

N Devtaprasanna; A Gunda; P Krishnamurthy; S.M Reddy; I Pomeranz

doi:10.1109/ATS.2005.68

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Conference proceeding

Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions

N Devtaprasanna, A Gunda, P Krishnamurthy, S.M Reddy and I Pomeranz

14th Asian Test Symposium (ATS'05), Vol.2005, pp.202-207

2005

DOI: 10.1109/ATS.2005.68

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Abstract

We describe a novel method to partition flip-flops in scan chains into disjoint groups of flip-flops that are to be driven by independent scan enable signals to achieve higher delay fault coverage. The proposed method to partition flip-flops is motivated by our recent work which demonstrated that driving subsets of flip-flops by independent scan enable signals to launch signal transitions will lead to higher delay fault coverage by broadside tests. As in broadside test none of the scan enable signals need to switch at-speed. Experimental results for delay fault coverage improvement on larger ISCAS-89 benchmark and industrial circuits are presented

Benchmark testing

Circuit faults

Circuit testing

Clocks

Delay

Design methodology

Flip-flops

Integrated circuit testing

Signal design

Switches

Details

Title: Subtitle: Improved Delay Fault Coverage Using Subsets of Flip-flops to Launch Transitions
Creators: N Devtaprasanna - University of Iowa
A Gunda - LSI Corporation
P Krishnamurthy - LSI Corporation
S.M Reddy - University of Iowa
I Pomeranz - Purdue University West Lafayette
Resource Type: Conference proceeding
Publication Details: 14th Asian Test Symposium (ATS'05), Vol.2005, pp.202-207
DOI: 10.1109/ATS.2005.68
ISSN: 1081-7735
eISSN: 2377-5386
Publisher: IEEE
Language: English
Date published: 2005
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197191802771

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