Conference proceeding
Improving compressed test pattern generation for multiple scan chain failure diagnosis
Proceedings of the Conference on design, automation and test in europe, pp.1000-1005
DATE '09
Design, Automation & Test in Europe Conference in Exhibition (Nice, France, 04/20/2009 - 04/24/2009)
04/20/2009
DOI: 10.1109/DATE.2009.5090810
Abstract
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the errors in responses due to defects which are captured in scan cells are not directly observed. We propose a simple and effective way to enhance the diagnostic resolution achievable by production tests with minimal increase in pattern counts. In this work we present experimental results for the case of multiple scan chain faults to demonstrate the effectiveness of the proposed method.
Details
- Title: Subtitle
- Improving compressed test pattern generation for multiple scan chain failure diagnosis
- Creators
- Xun TangRuifeng GuoWu-Tung ChengSudhakar Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the Conference on design, automation and test in europe, pp.1000-1005
- Conference
- Design, Automation & Test in Europe Conference in Exhibition (Nice, France, 04/20/2009 - 04/24/2009)
- Publisher
- European Design and Automation Association
- Series
- DATE '09
- DOI
- 10.1109/DATE.2009.5090810
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 04/20/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198002002771
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