Conference proceeding
Improving the Detectability of Resistive Open Faults in Scan Cells
2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.383-391
10/2009
DOI: 10.1109/DFT.2009.30
Abstract
Recent studies have shown that new tests are required for the detection of a large percentage of scan cell internal open faults which are not detected by the existing tests. However, the additional coverage due to the new tests drops significantly when opens with moderate resistances are considered. In this paper we propose to augment earlier test methods to detect internal scan chain opens with a wider range of resistances. The newly proposed method includes application of tests at higher temperatures and modifications to an earlier proposed flush test. We also present an analysis to explain the additional coverage obtained by the proposed test methods.
Details
- Title: Subtitle
- Improving the Detectability of Resistive Open Faults in Scan Cells
- Creators
- Fan Yang - University of IowaSreejit Chakravarty - LSI CorporationNarendra Devta-Prasanna - LSI Corp., Milpitas, CA, USASudhakar M Reddy - University of IowaIrith Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp.383-391
- DOI
- 10.1109/DFT.2009.30
- ISSN
- 1550-5774
- eISSN
- 2377-7966
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197301202771
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