Conference proceeding
Improving the proportion of at-speed tests in scan BIST
IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140), Vol.2000-, pp.459-463
2000
DOI: 10.1109/ICCAD.2000.896514
Abstract
A method to select the lengths of functional sequences in a BIST scheme for scan designs is proposed in this paper. A functional sequence is a sequence of primary input vectors applied when the circuit operates as a sequential circuit, without using scan. These sequences can be applied at-speed, i.e., at the normal circuit clock speed. The objectives set for choosing the lengths of the functional sequences are to increase the number of vectors applied at-speed, and to reduce the number of settings of functional sequence lengths, without compromising the fault coverage achieved. The experimental results presented demonstrate that compared to earlier methods, the proposed method achieves the above objectives while also achieving higher fault coverages for most of the benchmark circuits considered.
Details
- Title: Subtitle
- Improving the proportion of at-speed tests in scan BIST
- Creators
- Y Huang - Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USAI PomeranzS.M ReddyJ Rajski
- Resource Type
- Conference proceeding
- Publication Details
- IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140), Vol.2000-, pp.459-463
- Publisher
- IEEE
- DOI
- 10.1109/ICCAD.2000.896514
- ISSN
- 1092-3152
- Language
- English
- Date published
- 2000
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197206402771
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