Input test data volume reduction based on test vector chains

Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/ETSYM.2010.5512753

Back

Conference proceeding

Input test data volume reduction based on test vector chains

Irith Pomeranz and Sudhakar M Reddy

2010 15th IEEE European Test Symposium, pp.240-240

05/2010

DOI: 10.1109/ETSYM.2010.5512753

View Online

Abstract

The concept of test vector chains was introduced in the context of simulation-based test generation. Test vector chains provide a specific algorithm for performing single-bit changes in order to obtain new test vectors from existing ones. In this algorithm, two test vectors tη and ti2 are used. The test vector chain C(tn,ti2) is obtained by gradually modifying tη into ti2. Starting from tη, each additional test vector in C(tn,ti2) is one bit further from tη and one bit closer to ti2 until ti2 is obtained. It was demonstrated that a test set T has a significant number of test vector chains that are effective in (1) increasing the numbers of detections of faults that were targeted during the generation of Γ; (2) increasing the fault coverage of faults that were not targeted during the generation of Γ; and (3) increasing the fault coverage of target faults when T does not detect all the target faults.

Circuit faults

Circuit testing

Compaction

Computational modeling

Context modeling

Encoding

Fault detection

Logic testing

Performance evaluation

Test data compression

Details

Title: Subtitle: Input test data volume reduction based on test vector chains
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 2010 15th IEEE European Test Symposium, pp.240-240
DOI: 10.1109/ETSYM.2010.5512753
ISSN: 1530-1877
eISSN: 1558-1780
Publisher: IEEE
Language: English
Date published: 05/2010
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197176602771

Metrics

11 Record Views