Conference proceeding
Level of similarity: a metric for fault collapsing
Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe - Volume 1; 16-20 Feb. 2004
Design, Automation and Test in Europe Conference in Exhibition (Paris, France, 02/16/2004–02/20/2004)
02/16/2004
DOI: 10.1109/DATE.2004.1268827
Abstract
We describe a new approach to fault collapsing that extends fault collapsing based on fault equivalence and fault dominance. The new approach is based on a metric called level of similarity between faults. Informally, a fault f/sub j/ is said to be similar to a fault f/sub i/ with a level of similarity SL/sub i,j/ /spl les/ 1 if a fraction SL/sub i,j/ of the tests for f/sub i/ also detect f/sub j/. If SL/sub i,j/ is high enough, one may exclude f/sub j/ from the set of target faults and rely on the test for f/sub i/ (and tests for other faults) to detect f/sub j/. We describe a procedure for fault collapsing based on the level of similarity, and study its effectiveness experimentally.
Details
- Title: Subtitle
- Level of similarity: a metric for fault collapsing
- Creators
- Irith PomeranzSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Design, Automation, and Test in Europe: Proceedings of the conference on Design, automation and test in Europe - Volume 1; 16-20 Feb. 2004
- Conference
- Design, Automation and Test in Europe Conference in Exhibition (Paris, France, 02/16/2004–02/20/2004)
- DOI
- 10.1109/DATE.2004.1268827
- ISSN
- 1530-1591
- Language
- English
- Date published
- 02/16/2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198003602771
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