Conference proceeding
Markov source based test length optimized SCAN-BIST architecture
2009 10th International Symposium on Quality Electronic Design, pp.708-713
03/2009
DOI: 10.1109/ISQED.2009.4810380
Abstract
Markov sources have been shown to be efficient pseudo-random pattern generators in SCAN-BIST. In this paper we give a new design for Markov sources. The new design first reduces the ATPG test set by removing the test cubes with low sampling probability and then produces test sequences based on a unique dynamic transition selection technique. Dynamic transition selection offers four transition options namely Markov source, inverted Markov source, fixed 0 and fixed 1. Experimental results show that the proposed design significantly reduces the test length to achieve 100% stuck-at fault coverage at the expense of a modest increase in the number of gates required to implement the test pattern generator.
Details
- Title: Subtitle
- Markov source based test length optimized SCAN-BIST architecture
- Creators
- Aftab Farooqi - Texas Tech UniversityRichard O Gale - Texas Tech UniversitySudhakar M Reddy - University of IowaBrian Nutter - Texas Tech UniversityChris Monico - Texas Tech University
- Resource Type
- Conference proceeding
- Publication Details
- 2009 10th International Symposium on Quality Electronic Design, pp.708-713
- Publisher
- IEEE
- DOI
- 10.1109/ISQED.2009.4810380
- ISSN
- 1948-3287
- eISSN
- 1948-3295
- Language
- English
- Date published
- 03/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197426402771
Metrics
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