Conference proceeding
Max-Fill: A method to generate high quality delay tests
14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp.375-380
04/2011
DOI: 10.1109/DDECS.2011.5783114
Abstract
It was recently observed that the methods to generate scan based tests with low switching activity cause about 40% less activity than functional tests. Thus such tests may cause test escapes as they may not adequately stress the circuits under test. In this work we propose a method called Max-Fill to generate high quality partially-functional broadside delay tests. The generated tests are shown to cause switching activity close to the switching activity during functional operation. The method computes a set of reachable states in which states are likely to cause high switching activity. During test generation phase, these states are used as background states to fill the unspecified bits of test cubes. Additionally, the number of test patterns produced is less than that produced by low power test methods. Experimental results for ISCAS-89 circuits are given.
Details
- Title: Subtitle
- Max-Fill: A method to generate high quality delay tests
- Creators
- X Fan - University of IowaS M Reddy - University of IowaI Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, pp.375-380
- DOI
- 10.1109/DDECS.2011.5783114
- Publisher
- IEEE
- Language
- English
- Date published
- 04/2011
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197441602771
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