Conference proceeding
Methods for improving transition delay fault coverage using broadside tests
IEEE International Conference on Test, 2005, Vol.2005, pp.10 pp-265
2005
DOI: 10.1109/TEST.2005.1583983
Abstract
Testing of delay faults require two pattern tests. Broadside and skewed-load testing are two approaches to test for delay faults in scan designs. The broadside approach is often preferred over the skewed-load approach in designs that also use the system clock for scan operations, since skewed-load requires a fast (at-speed) scan enable signal while broadside testing does not. In this paper, we propose new scan flip-flops to improve delay fault coverage for circuits with scan using broadside tests. The proposed flip-flops do not require a control signal to switch at-speed. This is a distinct advantage as the design effort required for timing closure of such control signals is significant. We also propose a circuit topology based flip-flop selection procedure that offers a scalable method for increasing the transition fault coverage. Experimental results on industrial circuits are included
Details
- Title: Subtitle
- Methods for improving transition delay fault coverage using broadside tests
- Creators
- N Devtaprasanna - University of IowaA GundaP KrishnamurthyS.M ReddyI Pomeranz
- Resource Type
- Conference proceeding
- Publication Details
- IEEE International Conference on Test, 2005, Vol.2005, pp.10 pp-265
- Publisher
- IEEE
- DOI
- 10.1109/TEST.2005.1583983
- ISSN
- 1089-3539
- eISSN
- 2378-2250
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197543902771
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