Conference proceeding
Multiple fault activation cycle tests for transistor stuck-open faults
2010 IEEE International Test Conference, pp.1-1
11/2010
DOI: 10.1109/TEST.2010.5699313
Abstract
The usefulness of scan tests with multiple fault activation cycles to improve the coverage of transistor stuck-open faults is investigated. A recent work demonstrated that tests with more than one fault activation cycle can detect additional transition delay faults and inline resistance faults when compared to two-pattern tests applied using the broadside or skewed-load methods. We extend this work to show that such tests can also be used for testing additional transistor stuck-open faults. Experimental results for coverage improvement in several ISCAS-89 benchmark circuits will be discussed.
Details
- Title: Subtitle
- Multiple fault activation cycle tests for transistor stuck-open faults
- Creators
- N Devta-Prasanna - LSI Corp., Milpitas, CA, USAA Gunda - LSI CorporationS M Reddy - University of IowaI Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 2010 IEEE International Test Conference, pp.1-1
- DOI
- 10.1109/TEST.2010.5699313
- ISSN
- 1089-3539
- eISSN
- 2378-2250
- Publisher
- IEEE
- Language
- English
- Date published
- 11/2010
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197538802771
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