Multiple scan tree design with test vector modification

Conference proceeding

Kohei Miyase, Seiji Kajihara and Sudhakar M Reddy

13th Asian Test Symposium, pp.76-81

Asian Test Symposium, 13 (Kenting, Taiwan, 11/15/2004 - 11/17/2004)

2004

DOI: 10.1109/ATS.2004.61

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Applied Sciences

Integrated Circuits

Circuit properties

Design. Technologies. Operation analysis. Testing

Digital circuits

Electric, optical and optoelectronic circuits

Electronic circuits

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Title: Subtitle: Multiple scan tree design with test vector modification
Creators: Kohei Miyase - Kyushu Institute of Technology
Seiji Kajihara - Kyushu Institute of Technology
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 13th Asian Test Symposium, pp.76-81
Conference: Asian Test Symposium, 13 (Kenting, Taiwan, 11/15/2004 - 11/17/2004)
Publisher: IEEE Computer Society
DOI: 10.1109/ATS.2004.61
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198011802771

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