Conference proceeding
N-distinguishing Tests for Enhanced Defect Diagnosis
2009 Asian Test Symposium, pp.183-186
11/2009
DOI: 10.1109/ATS.2009.47
Abstract
Diagnostic ATPG has traditionally been used to generate test patterns that distinguish pairs of modeled faults. In this work, we investigate the use of n-distinguishing test sets, which distinguish pairs of single stuck-at faults n times, to enhance the probability of distinguishing unmodeled defects. The basis for the use of n-distinguishing test sets to enhance defect diagnosis is similar to that for using n-detection test sets to improve the detection of unmodeled defects. We use a heuristic to target a subset of fault pairs for n-distinguishing in order to improve the efficacy of the patterns generated for aiding diagnosis. Experimental results on the larger ISCAS benchmark circuits are presented to demonstrate the improvements in defect diagnostic resolution due to the use of n-distinguishing test sets. We use randomly selected resistive bridges to represent unmodeled defects. The experimental results also show that the coverage of unmodeled defects by n-distinguishing test sets is similar to that by n-detection test sets even though the number of n-distinguishing tests is typically smaller. This suggests the possibility of using n-distinguishing test sets in place of n-detection test sets in manufacturing test.
Details
- Title: Subtitle
- N-distinguishing Tests for Enhanced Defect Diagnosis
- Creators
- Gang Chen - Mentor Graphics (United States)Janusz Rajski - Mentor Graphics (United States)Sudhakar Reddy - University of IowaIrith Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 2009 Asian Test Symposium, pp.183-186
- DOI
- 10.1109/ATS.2009.47
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Publisher
- IEEE
- Language
- English
- Date published
- 11/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197418202771
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