New procedures to identify redundant stuck-at faults and removal of redundant logic

Gang Chen; Sudhakar Reddy; Irith Pomeranz; Janusz Rajski

doi:10.1109/VLSID.2006.120

Back

Conference proceeding

New procedures to identify redundant stuck-at faults and removal of redundant logic

Gang Chen, Sudhakar Reddy, Irith Pomeranz and Janusz Rajski

19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), Vol.2006, pp.6 pp-424

2006

DOI: 10.1109/VLSID.2006.120

View Online

Abstract

We present new procedures for identifying redundant stuck-at faults including multiple line stuck-at faults on the branches of fan-out stems. The methods proposed include new procedures to identify stuck-at faults that are simultaneously redundant thus allowing simultaneous removal of logic associated with several redundant faults. Experimental results on benchmark as well as industrial circuits are also presented to demonstrate the effectiveness of the proposed methods.

Benchmark testing

Bridge circuits

Circuit faults

Circuit testing

Fault diagnosis

Integrated circuit interconnections

Logic circuits

Logic testing

Redundancy

Test pattern generators

Details

Title: Subtitle: New procedures to identify redundant stuck-at faults and removal of redundant logic
Creators: Gang Chen - University of Iowa
Sudhakar Reddy - University of Iowa
Irith Pomeranz - Purdue University West Lafayette
Janusz Rajski - Mentor Graphics (United States)
Resource Type: Conference proceeding
Publication Details: 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design (VLSID'06), Vol.2006, pp.6 pp-424
DOI: 10.1109/VLSID.2006.120
ISSN: 1063-9667
eISSN: 2380-6923
Publisher: IEEE
Language: English
Date published: 2006
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197211102771

Metrics

16 Record Views