Conference proceeding
On Compacting Test Response Data Containing Unknown Values
Proceedings of the 2003 IEEE/ACM international conference on computer-aided design, pp.855-862
ICCAD '03
International Conference on Computer Aided Design (ICCAD) (San Jose, California, 11/09/2003 - 11/13/2003)
11/09/2003
DOI: 10.1109/ICCAD.2003.159775
Abstract
The design of a test response compactor called a Block Compactoris given. Block Compactors belong to a new class of compactorscalled Finite Memory Compactors. Different from spacecompactors, finite memory compactors contain memory elements.Also unlike time compactors, finite memory compactors havefinite impulse response. These properties give finite memorycompactors the ability to achieve higher compaction ratios thanspace compactors and still be able to tolerate unknown values intest responses. The proposed Block Compactors, as an instance offinite memory compactors generate a signature of response data inseveral scan cycles. Results presented on several industrial designsshow that Block Compactors provide better test quality and higherdata compaction than earlier works on test response compactors.
Details
- Title: Subtitle
- On Compacting Test Response Data Containing Unknown Values
- Creators
- Chen WangSudhakar ReddyIrith PomeranzJanusz RajskiJerzy Tyszer
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 2003 IEEE/ACM international conference on computer-aided design, pp.855-862
- Conference
- International Conference on Computer Aided Design (ICCAD) (San Jose, California, 11/09/2003 - 11/13/2003)
- Publisher
- IEEE Computer Society
- Series
- ICCAD '03
- DOI
- 10.1109/ICCAD.2003.159775
- ISSN
- 1092-3152
- Language
- English
- Date published
- 11/09/2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197906202771
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