On Improving Defect Coverage of Stuck-at Fault Tests

Kohei Miyase; Kenta Terashima; Seiji Kajihara; Xiaoqing Wen; Sudhakar M Reddy

doi:10.1109/ATS.2005.84

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On Improving Defect Coverage of Stuck-at Fault Tests

Kohei Miyase, Kenta Terashima, Seiji Kajihara, Xiaoqing Wen and Sudhakar M Reddy

14th Asian Test Symposium (ATS'05), Vol.2005, pp.216-223

2005

DOI: 10.1109/ATS.2005.84

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Abstract

Recently design for manufacturability (DFM) has been required to achieve higher process yield. Information obtained from silicon by testing and/or fault analysis is sometimes fed back for redesign of VLSI circuits. In this paper we propose a method to maximize defect coverage of a test set initially generated for stuck-at faults in a full scan sequential circuit by using feed back information from fault analysis. If a test set for more complex faults than stuck-at faults is generated, higher defect coverage would be obtained. Such a test set, however, would have a large number of test vectors, and hence the test costs would go up. The proposed method improves defect coverage of the test set by not adding new test vectors but modifying test vectors with the information obtained from fault analysis. Therefore there are no negative impacts on test data volume and test application time. The initial fault coverage for stuck-at faults of the test set is guaranteed with modified test vectors. In this paper we focus on detecting as many as possible non-feedback AND/OR-type bridging faults. Experimental results show that the proposed method significantly decreases the number of non-feedback AND/OR-type bridging faults undetected by a test set generated for stuck-at faults

Circuit faults

Circuit testing

Design for manufacture

Feeds

Information analysis

Manufacturing processes

Sequential analysis

Sequential circuits

Silicon

Very large scale integration

Details

Title: Subtitle: On Improving Defect Coverage of Stuck-at Fault Tests
Creators: Kohei Miyase - Japan Sci. & Technol. Agency, Fukuoka
Kenta Terashima - Kyushu Institute of Technology
Seiji Kajihara - Kyushu Institute of Technology
Xiaoqing Wen - Kyushu Institute of Technology
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 14th Asian Test Symposium (ATS'05), Vol.2005, pp.216-223
Publisher: IEEE
DOI: 10.1109/ATS.2005.84
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 2005
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197190502771

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