Conference proceeding
On Improving Diagnostic Test Generation for Scan Chain Failures
2009 Asian Test Symposium, pp.41-46
11/2009
DOI: 10.1109/ATS.2009.21
Abstract
In this paper, we present test generation procedures to improve scan chain failure diagnosis. The proposed test generation procedures improve diagnostic resolution by using multi-cycle scan test patterns. A diagnostic test generation flow to speed up diagnosis is proposed to address the issue of long run times of test generation and large number of test patterns for the cases where the range of suspected cells is large. Experimental results on several industrial designs show the effectiveness of the proposed procedures in improving diagnostic resolution, reducing run times of test generation and also reducing the number of test patterns.
Details
- Title: Subtitle
- On Improving Diagnostic Test Generation for Scan Chain Failures
- Creators
- Xun Tang - University of IowaRuifeng Guo - Mentor GraphicsWu-Tung Cheng - Mentor GraphicsS.M Reddy - University of IowaYu Huang - Mentor Graphics
- Resource Type
- Conference proceeding
- Publication Details
- 2009 Asian Test Symposium, pp.41-46
- DOI
- 10.1109/ATS.2009.21
- ISSN
- 1081-7735
- eISSN
- 2377-5386
- Publisher
- IEEE
- Language
- English
- Date published
- 11/2009
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197524902771
Metrics
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