Conference proceeding
On determining scan flip-flops in partial-scan designs
1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers, pp.322-325
International Conference on Computer Aided Design (ICCAD) (Santa Clara, California, USA, 11/11/1990–11/15/1990)
1990
DOI: 10.1109/ICCAD.1990.129914
Abstract
A report is presented on procedures investigated to determine flip-flops to be scanned in partial-scan designs for sequential circuits. The main idea pursued is to derive a minimal feedback vertex set of the so-called S-graphs. Results of applying optimal and heuristic procedures on a set of benchmark circuits indicate that heuristic methods give fast and near minimal solutions.< >
Details
- Title: Subtitle
- On determining scan flip-flops in partial-scan designs
- Creators
- D.H Lee - University of IowaS.M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 1990 IEEE International Conference on Computer-Aided Design. Digest of Technical Papers, pp.322-325
- Conference
- International Conference on Computer Aided Design (ICCAD) (Santa Clara, California, USA, 11/11/1990–11/15/1990)
- DOI
- 10.1109/ICCAD.1990.129914
- Publisher
- IEEE Comput. Soc. Press
- Language
- English
- Date published
- 1990
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198004002771
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