Conference proceeding
On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios
18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design, pp.59-64
International Conference on VLSI Design, 18 (Kolkata, India, 01/03/2005–01/07/2005)
2005
DOI: 10.1109/ICVD.2005.127
Abstract
We propose an enhanced selective compaction scheme, which integrates three techniques, called selectively filled tests, selective chains masking and selective chains observation, to reduce the impact of unknown values on the test response compaction ratio. Experimental results on several industrial designs demonstrate the effectiveness of the proposed scheme in achieving a very high test response compaction ratio without compromising the test quality.
Details
- Title: Subtitle
- On efficient X-handling using a selective compaction scheme to achieve high test response compaction ratios
- Creators
- Huaxing Tang - University of IowaChen Wang - Mentor Graphics (United States)Janusz Rajski - Mentor Graphics (United States)Sudhakar M Reddy - University of IowaJerzy Tyszer - Poznań University of TechnologyIrith Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 18th International Conference on VLSI Design held jointly with 4th International Conference on Embedded Systems Design, pp.59-64
- Conference
- International Conference on VLSI Design, 18 (Kolkata, India, 01/03/2005–01/07/2005)
- DOI
- 10.1109/ICVD.2005.127
- ISSN
- 1063-9667
- eISSN
- 2380-6923
- Publisher
- IEEE
- Language
- English
- Date published
- 2005
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984198003402771
Metrics
25 Record Views