On generating high quality tests for transition faults

Yun Shao; I Pomeranz; S.M Reddy

doi:10.1109/ATS.2002.1181676

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Conference proceeding

On generating high quality tests for transition faults

Yun Shao, I Pomeranz and S.M Reddy

Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02), Vol.2002-, pp.1-8

2002

DOI: 10.1109/ATS.2002.1181676

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Abstract

In this work we propose a path-oriented test generation procedure called POTENT to generate high quality tests for transition faults. Both weak non-robust and strong non-robust tests can be generated by POTENT. We classify, transition fault tests into six types according to their activation and propagation methods. The basic idea of POTENT is to test a transition fault along a longest testable path passing through the fault site. For transition faults that are activated or propagated through multipaths, heuristics are proposed to maximize the propagation delay of the target fault. We also propose an efficient method to evaluate the quality of a given transition fault test set. Experimental results show that POTENT generates higher quality transition fault test sets than the conventional test generation method.

Circuit faults

Circuit testing

Cities and towns

Clocks

Delay effects

Fault detection

Logic circuits

Logic testing

Propagation delay

Sequential circuits

Details

Title: Subtitle: On generating high quality tests for transition faults
Creators: Yun Shao - University of Iowa
I Pomeranz
S.M Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings of the 11th Asian Test Symposium, 2002. (ATS '02), Vol.2002-, pp.1-8
Publisher: IEEE
DOI: 10.1109/ATS.2002.1181676
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197111602771

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