Conference proceeding
On improving fault diagnosis for synchronous sequential circuits
Proceedings of the 31st annual Design Automation Conference, pp.504-509
DAC '94
06/06/1994
DOI: 10.1145/196244.196517
Abstract
The multiple observation times approach was proposed as a test generation approach for fault detection, and was shown to alleviate deficiencies of conventional test generators. In this work, the multiple observation times approach is applied to fault location. It is shown that the use of multiple observation times has the potential of significantly enhancing the resolution of a given test set. A definition of pass/fail diagnosis suitable for the multiple observation times approach is also given. Experimental results are provided to demonstrate the approach and its advantages.
Details
- Title: Subtitle
- On improving fault diagnosis for synchronous sequential circuits
- Creators
- Irith Pomeranz - University of IowaSudhakar Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 31st annual Design Automation Conference, pp.504-509
- Publisher
- ACM
- Series
- DAC '94
- DOI
- 10.1145/196244.196517
- ISSN
- 0738-100X
- Language
- English
- Date published
- 06/06/1994
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197530702771
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