Conference proceeding
On improving genetic optimization based test generation
Proceedings European Design and Test Conference. ED & TC 97, pp.506-511
1997
DOI: 10.1109/EDTC.1997.582408
Abstract
Test generation procedures based on genetic optimization were shown to be effective in achieving high fault coverage for benchmark circuits. In a genetic optimization procedure, the crossover operator accepts two test patterns t/sub 1/ and t/sub 2/, and randomly copies parts of t/sub 1/ and parts of t/sub 2/ into one or more new test patterns. Such a procedure does not take advantage of circuit properties that may aid in generating more effective test patterns. In this work, we propose a representation of test patterns where subsets of inputs are considered as indivisible entities. Using this representation, crossover copies all the values of each subset either from t/sub 1/ or from t/sub 2/. By keeping input subsets undivided, activation and propagation capabilities of t/sub 1/ and t/sub 2/ are captured and carried over to the new test patterns. The effectiveness of this scheme is demonstrated by experimental results.
Details
- Title: Subtitle
- On improving genetic optimization based test generation
- Creators
- I Pomeranz - Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USAS.M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings European Design and Test Conference. ED & TC 97, pp.506-511
- Publisher
- IEEE
- DOI
- 10.1109/EDTC.1997.582408
- ISSN
- 1066-1409
- eISSN
- 2377-6323
- Language
- English
- Date published
- 1997
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197349402771
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