On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations

Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/TEST.2001.966636

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Conference proceeding

On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations

Irith Pomeranz and Sudhakar M Reddy

Proceedings International Test Conference 2001 (Cat. No.01CH37260), pp.211-220

2001

DOI: 10.1109/TEST.2001.966636

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Abstract

Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of tests, are typically also applied. This increases the amount of test resources required for test application. We describe a procedure for inserting (limited) scan operations into a functional sequence in order to improve its stuck-at fault coverage, thus reducing or eliminating the need for separate scan-based stuck-at tests. Between scan operations, the functional sequence is still applied at-speed: however, a higher stuck-at fault coverage is achieved.

Circuit faults

Circuit testing

Cities and towns

Compaction

Electrical fault detection

Fault detection

Sequential analysis

Sequential circuits

Very large scale integration

Details

Title: Subtitle: On improving the stuck-at fault coverage of functional test sequences by using limited-scan operations
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings International Test Conference 2001 (Cat. No.01CH37260), pp.211-220
DOI: 10.1109/TEST.2001.966636
ISSN: 1089-3539
eISSN: 2378-2250
Publisher: IEEE
Language: English
Date published: 2001
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197196902771

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