On multiple bridging faults

Irith Pomeranz; Sudhakar M Reddy

doi:10.1109/VTS.2010.5469573

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Conference proceeding

On multiple bridging faults

Irith Pomeranz and Sudhakar M Reddy

2010 28th VLSI Test Symposium (VTS), pp.221-226

04/2010

DOI: 10.1109/VTS.2010.5469573

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Abstract

Multiple faults are typically detected by test sets for single faults. For bridging faults, we show that fault activation conditions are more difficult to create for certain multiple faults than for the single faults that comprise them. As a result, a test set for single bridging faults may leave significant percentages of detectable multiple faults undetected. We discuss three such cases, corresponding to three types of bridging faults, and present experimental results for one of them. As part of this study we consider the ability of a 10-detection test set for single stuck-at faults to detect multiple bridging faults of this type.

bridging faults

Circuit faults

Cities and towns

Electrical fault detection

Fault detection

fault simulation

Manufacturing

multiple faults

n -detection test sets

Robustness

test generation

Testing

Very large scale integration

Details

Title: Subtitle: On multiple bridging faults
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: 2010 28th VLSI Test Symposium (VTS), pp.221-226
DOI: 10.1109/VTS.2010.5469573
ISSN: 1093-0167
eISSN: 2375-1053
Publisher: IEEE
Language: English
Date published: 04/2010
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197232702771

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