Conference proceeding
On n-detection test sequences for synchronous sequential circuits
15TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.336-342
1997
DOI: 10.1109/VTEST.1997.600299
Abstract
Test sets that detect each stuck-at fault n > 1 times (called n-detection test sets) were shown to achieve higher defect coverages than conventional single stuck-at 1-detection test sets. Previous studies of n-detection test sets concentrated on combinational circuits. In this work, we study n-detection test sequences for synchronous sequential circuits. We propose four definitions of the number of detections achieved by a test sequence. We describe fault simulation and test generation procedures based on these definitions, and evaluate them on benchmark circuits by using non-feedback bridging faults to model defects. The results indicate the usefulness of the simplest definition in generating test sequences that achieve improved defect coverages.
Details
- Title: Subtitle
- On n-detection test sequences for synchronous sequential circuits
- Creators
- I Pomeranz - University of IowaS M ReddyIEEE COMP SOC
- Resource Type
- Conference proceeding
- Publication Details
- 15TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.336-342
- DOI
- 10.1109/VTEST.1997.600299
- Language
- English
- Date published
- 1997
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984231871002771
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