Conference proceeding
On n-detection test sets and variable n-detection test sets for transition faults
17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.173-179
1999
DOI: 10.1109/VTEST.1999.766662
Abstract
We study the effectiveness of n-detection test sets based on transition faults in detecting defects that affect the timing behavior of a circuit. We use path delay faults as surrogates for unmodeled defects, and show that the path delay fault coverage achieved by an n-detection transition fault test set increases significantly as n is increased. We also introduce a method to reduce the number of tests included in an n-detection test set by using different values of n for different faults based on their potential effect on the defect coverage. The resulting test sets are referred to as variable n-detection test sets.
Details
- Title: Subtitle
- On n-detection test sets and variable n-detection test sets for transition faults
- Creators
- I Pomeranz - University of IowaS M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.173-179
- DOI
- 10.1109/VTEST.1999.766662
- Language
- English
- Date published
- 1999
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984231871202771
Metrics
10 Record Views