On reducing test data volume and test application time for multiple scan chain designs

Conference proceeding

Huaxing Tang, S.M Reddy and I Pomeranz

International Test Conference, 2003. Proceedings. ITC 2003, Vol.1, pp.1079-1088

International Test Conference (ITC) (Charlotte, North Carolina, 09/30/2003 - 10/02/2003)

2003

DOI: 10.1109/TEST.2003.1271096

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Broadcasting

Circuit faults

Circuit testing

Cities and towns

Costs

Encoding

Switches

Switching circuits

Test data compression

Very large scale integration

Title: Subtitle: On reducing test data volume and test application time for multiple scan chain designs
Creators: Huaxing Tang - University of Iowa
S.M Reddy
I Pomeranz
Resource Type: Conference proceeding
Publication Details: International Test Conference, 2003. Proceedings. ITC 2003, Vol.1, pp.1079-1088
Conference: International Test Conference (ITC) (Charlotte, North Carolina, 09/30/2003 - 10/02/2003)
Publisher: IEEE
DOI: 10.1109/TEST.2003.1271096
ISSN: 1089-3539
eISSN: 2378-2250
Language: English
Date published: 2003
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197906302771

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