Conference proceeding
On removing redundant faults in synchronous sequential circuits
16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.168-175
1998
DOI: 10.1109/VTEST.1998.670865
Abstract
We describe a time-efficient procedure for removing sequentially redundant faults from synchronous sequential circuits with synchronizing sequences. We use properties of redundant faults and propose several methods to identify subsets of redundant faults that can be removed simultaneously from the circuit. By removing several redundant faults simultaneously, the number of repetitions of the test generation procedure invoiced to identify redundant faults is reduced. Experimental results presented in this work demonstrate the effectiveness of the proposed removal procedure.
Details
- Title: Subtitle
- On removing redundant faults in synchronous sequential circuits
- Creators
- X J Lin - University of IowaI PomeranzS M ReddyIEEE COMP SOC
- Resource Type
- Conference proceeding
- Publication Details
- 16TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, pp.168-175
- DOI
- 10.1109/VTEST.1998.670865
- Language
- English
- Date published
- 1998
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984232098402771
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