On static compaction of test sequences for synchronous sequential circuits

Conference proceeding

Irith Pomeranz and Sudhakar Reddy

Proceedings of the 33rd annual Design Automation Conference, pp.215-220

DAC '96

06/01/1996

DOI: 10.1145/240518.240558

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Title: Subtitle: On static compaction of test sequences for synchronous sequential circuits
Creators: Irith Pomeranz - University of Iowa
Sudhakar Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings of the 33rd annual Design Automation Conference, pp.215-220
Publisher: ACM
Series: DAC '96
DOI: 10.1145/240518.240558
ISSN: 0738-100X
Language: English
Date published: 06/01/1996
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197230902771

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