Conference proceeding
On test application time and defect detection capabilities of test sets for scan designs
2000 IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS & PROCESSORS, PROCEEDINGS, pp.395-400
2000
DOI: 10.1109/ICCD.2000.878314
Abstract
The test application time of test sets for scan designs can be reduced (without reducing the fault coverage) by removing some scan operations, and increasing the lengths of the primary input sequences applied between scan operations. In this work, we study the effects of such a compaction procedure on the ability of a test set to detect defects. Defect detection is measured by the number of times the test set detects each stuck-at fault, which was shown to be related to the defect coverage of the test set. We also propose a compaction procedure that affects the numbers of detections of stuck-at faults in a controlled way.
Details
- Title: Subtitle
- On test application time and defect detection capabilities of test sets for scan designs
- Creators
- Irith PomeranzSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- 2000 IEEE INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS & PROCESSORS, PROCEEDINGS, pp.395-400
- DOI
- 10.1109/ICCD.2000.878314
- Language
- English
- Date published
- 2000
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984231871702771
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