Conference proceeding
On test data compression and n-detection test sets
40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, pp.748-751
2003
DOI: 10.1145/775832.776023
Abstract
We consider the relationship between test data compression and the ability to perform comprehensive testing of a circuit under an n-detection test set. The size of an n-detection test set grows approximately linearly with n. Therefore, one may expect a decompresser that can decompress a compressed n-detection test set to be larger than a decompresser required for a compact conventional test seta The results presented in this work demonstrate that it is possible to use a decompresser designed based on a compact one-detection test set in order to apply an n-detection test set. Thus, the design of the decompresser does not have to be changed as n is increased. We describe a procedure that generates an n-detection test set to achieve this result.
Details
- Title: Subtitle
- On test data compression and n-detection test sets
- Creators
- Irith PomeranzSudhakar M Reddy
- Resource Type
- Conference proceeding
- Publication Details
- 40TH DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2003, pp.748-751
- DOI
- 10.1145/775832.776023
- Language
- English
- Date published
- 2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984232099002771
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