On test data volume reduction for multiple scan chain designs

Sudhakar M Reddy; Kohei Miyase; Seiji Kajihara; Irith Pomeranz

doi:10.1109/VTS.2002.1011119

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Conference proceeding

On test data volume reduction for multiple scan chain designs

Sudhakar M Reddy, Kohei Miyase, Seiji Kajihara and Irith Pomeranz

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), Vol.2002-, pp.103-108

2002

DOI: 10.1109/VTS.2002.1011119

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Abstract

We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can be used to evaluate the effectiveness of procedures for reducing the scan data volume. The metric compares the achieved compression to the compression which is intrinsic to the use of multiple scan chains. We also propose a procedure for modifying a given test set so as to achieve reductions in test data volume assuming a combinational decompressor circuit.

Microelectronics

Circuit faults

Circuit testing

Costs

Data engineering

Design engineering

Electronic equipment testing

Encoding

System testing

Very large scale integration

Details

Title: Subtitle: On test data volume reduction for multiple scan chain designs
Creators: Sudhakar M Reddy - University of Iowa
Kohei Miyase - Kyushu Institute of Technology
Seiji Kajihara - Kyushu Institute of Technology
Irith Pomeranz - Purdue University West Lafayette
Resource Type: Conference proceeding
Publication Details: Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), Vol.2002-, pp.103-108
DOI: 10.1109/VTS.2002.1011119
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197528802771

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