Conference proceeding
On test generation by input cube avoidance
Proceedings of the conference on design, automation and test in europe, pp.522-527
DATE '07
04/16/2007
DOI: 10.1109/DATE.2007.364646
Abstract
Test generation procedures attempt to assign values to the inputs of a circuit so as to detect target faults. We study a complementary view whereby the goal is to identify values that should not be assigned to inputs in order not to prevent faults from being detected. We describe a procedure for computing input cubes (or incompletely specified input vectors) that should be avoided during test generation for target faults. We demonstrate that avoiding such input cubes leads to the detection of target faults after the application of limited numbers of random input vectors. This indicates that explicit test generation is not necessary once certain input values are precluded. Potential uses of the computed input cubes are in a test generation procedure to reduce the search space, and during built-in test generation to preclude input vectors that will not lead to the detection of target faults.
Details
- Title: Subtitle
- On test generation by input cube avoidance
- Creators
- Irith PomeranzSudhakar Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on design, automation and test in europe, pp.522-527
- Publisher
- EDA Consortium
- Series
- DATE '07
- DOI
- 10.1109/DATE.2007.364646
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 04/16/2007
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197548402771
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