Conference proceeding
On test generation for transition faults with minimized peak power dissipation
Proceedings of the 41st annual Design Automation Conference, pp.504-509
Design automation conference (proceedings 2004)
2004
DOI: 10.1145/996566.996706
Abstract
This paper presents a method of generating tests for transition faults using tests for stuck-at faults such that the peak power is the minimum possible using a given set of tests for stuck-at faults. The proposed method is suitable for use in testing scan designs that employ enhanced scan. The method reduces the peak power consumption in benchmark circuits by 19% on the average with essentially the same test set size and the same fault coverage compared to an earlier method.
Details
- Title: Subtitle
- On test generation for transition faults with minimized peak power dissipation
- Creators
- WEI LI - University of IowaSudhakar M Reddy - University of IowaIrith Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the 41st annual Design Automation Conference, pp.504-509
- Conference
- Design automation conference (proceedings 2004)
- DOI
- 10.1145/996566.996706
- ISSN
- 0738-100X
- Publisher
- Association for Computing Machinery
- Language
- English
- Date published
- 2004
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197519802771
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