On testing of interconnect open defects in combinational logic circuits with stems of large fanout

Conference proceeding

Sudhakar M Reddy, Irith Pomeranz, HUAXING Tang, Seiji Kajihara and Kozo Kinoshita

Proceedings - International Test Conference, pp.83-89

International Test Conference (ITC) (Baltimore, Maryland, USA, 10/10/2002)

2002

DOI: 10.1109/TEST.2002.1041748

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Applied Sciences

Integrated Circuits

Circuit properties

Design. Technologies. Operation analysis. Testing

Digital circuits

Electric, optical and optoelectronic circuits

Electronic circuits

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: On testing of interconnect open defects in combinational logic circuits with stems of large fanout
Creators: Sudhakar M Reddy - Iowa State University
Irith Pomeranz - Purdue University West Lafayette
HUAXING Tang - University of Iowa
Seiji Kajihara - Kyushu Institute of Technology
Kozo Kinoshita - Osaka Gakuin University
Resource Type: Conference proceeding
Publication Details: Proceedings - International Test Conference, pp.83-89
Conference: International Test Conference (ITC) (Baltimore, Maryland, USA, 10/10/2002)
DOI: 10.1109/TEST.2002.1041748
ISSN: 1089-3539
eISSN: 2378-2250
Publisher: IEEE
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198014502771

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