Conference proceeding
On the Characterization of Hard-to-Detect Bridging Faults
Proceedings of the conference on design, automation and test in europe, Vol.1, pp.1012-1017
DATE '03
03/03/2003
DOI: 10.1109/DATE.2003.1253737
Abstract
We investigate a characterization of hard-to-detect bridging faults. For circuits with large numbers of lines (or nodes), this characterization can be used to select target faults for test generation when it is impractical to target all the bridging faults (or all the realistic bridging faults). We demonstrate that the faults selected based on the proposed characterization are indeed hard-to-detect by showing that the fault coverage of a given test set with respect to this subset is lower and more sensitive to the test set than the fault coverage obtained with respect to a random subset of the same size,with respect to the complete set of faults, and when possible,with respect to a subset of realistic bridging faults of the same size. We also demonstrate that a test set for the selected subset of faults detects other faults more effectively than when a test set is derived for a randomly selected subset of faults of the same size.
Details
- Title: Subtitle
- On the Characterization of Hard-to-Detect Bridging Faults
- Creators
- Irith PomeranzSudhakar ReddySandip Kundu
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on design, automation and test in europe, Vol.1, pp.1012-1017
- Publisher
- IEEE Computer Society
- Series
- DATE '03
- DOI
- 10.1109/DATE.2003.1253737
- ISSN
- 1530-1591
- eISSN
- 1558-1101
- Language
- English
- Date published
- 03/03/2003
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197223002771
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