Conference proceeding
On the Detectability of Scan Chain Internal Faults An Industrial Case Study
26th IEEE VLSI Test Symposium (vts 2008), pp.79-84
04/2008
DOI: 10.1109/VTS.2008.13
Abstract
Scan chains contain approximately 50% of the logic transistors in large industrial designs. Yet, faults in the scan cells are not directly targeted by scan tests and assumed detected by flush tests. Reported results of targeting the scan cell internal faults using checking sequences show such tests to be about 4.5 times longer than scan stuck-at test sets and require a sequential test generator, even for full scan circuits. We present the first step in developing an alternative test methodology for scan cell internal faults. Fault detection capability of existing tests (flush tests, stuck-at tests and transition delay fault tests) are quantified. Existing tests are shown to have similar coverage as checking sequences. A new flush test, viz. half-speed flush test, is defined. This new test is shown to add 2.3% and 8.8% to the stuck-at and stuck-on fault coverage, respectively.
Details
- Title: Subtitle
- On the Detectability of Scan Chain Internal Faults An Industrial Case Study
- Creators
- Fan Yang - University of IowaSreejit Chakravarty - LSI CorporationNarendra Devta-PrasannaSudhakar M Reddy - University of IowaI Pomeranz - Purdue University West Lafayette
- Resource Type
- Conference proceeding
- Publication Details
- 26th IEEE VLSI Test Symposium (vts 2008), pp.79-84
- DOI
- 10.1109/VTS.2008.13
- ISSN
- 1093-0167
- eISSN
- 2375-1053
- Publisher
- IEEE
- Language
- English
- Date published
- 04/2008
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197182402771
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