On the Replacement of Scan Chain Inputs by Primary Input Vectors

I Pomeranz; S.M Reddy

doi:10.1109/ATS.2006.261017

Back

Conference proceeding

On the Replacement of Scan Chain Inputs by Primary Input Vectors

I Pomeranz and S.M Reddy

2006 15th Asian Test Symposium, Vol.2006, pp.175-182

11/2006

DOI: 10.1109/ATS.2006.261017

View Online

Abstract

We show that the functionality of scan chain inputs sometimes exists in a circuit as part of its functional operation, and can be exhibited by applying specific primary input vectors. By relying on such functionality it is possible to hide scan chains as part of a solution that addresses security. It is also possible to reduce the number of external scan chain inputs that need to be added to the circuit as part of the scan implementation, or remove the need to multiplex primary inputs as scan chain inputs. We define inherent scan in functions to capture the functionality of scan chain inputs that exists in a circuit, and show that they can be computed effectively by simulation. We address the case where multiple scan chains are to be used for the circuit

Circuit simulation

Circuit testing

Cities and towns

Computational modeling

Cryptography

Data security

Decoding

Flip-flops

Hardware

Information security

Details

Title: Subtitle: On the Replacement of Scan Chain Inputs by Primary Input Vectors
Creators: I Pomeranz - Purdue University West Lafayette
S.M Reddy
Resource Type: Conference proceeding
Publication Details: 2006 15th Asian Test Symposium, Vol.2006, pp.175-182
Publisher: IEEE
DOI: 10.1109/ATS.2006.261017
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 11/2006
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197295902771

Metrics

3 Record Views