On the compaction of test sets produced by genetic optimization

I Pomeranz; S.M Reddy

doi:10.1109/ATS.1997.643906

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Conference proceeding

On the compaction of test sets produced by genetic optimization

I Pomeranz and S.M Reddy

Proceedings Sixth Asian Test Symposium (ATS'97), pp.4-9

Asian Test Symposium, 6 (Akita, Japan, 11/17/1997 - 11/19/1997)

1997

DOI: 10.1109/ATS.1997.643906

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Abstract

A previously proposed test generation procedure based on genetic optimization proved to have several advantages in terms of fault coverage; however, it produced large test set sizes. We investigate a way to generate compact test sets using this procedure by embedding it into a test compaction procedure. The compaction procedure constructs a compact test set out of the best tests contained in several test sets produced by the genetic optimization based test generation procedure. Using this approach, it is possible to significantly reduce the test set sizes obtained.

Genetic Engineering

Benchmark testing

Circuit faults

Circuit testing

Cities and towns

Compaction

Distributed power generation

Electrical fault detection

Fault detection

Tin

Details

Title: Subtitle: On the compaction of test sets produced by genetic optimization
Creators: I Pomeranz - University of Iowa
S.M Reddy
Resource Type: Conference proceeding
Publication Details: Proceedings Sixth Asian Test Symposium (ATS'97), pp.4-9
Conference: Asian Test Symposium, 6 (Akita, Japan, 11/17/1997 - 11/19/1997)
Publisher: IEEE
DOI: 10.1109/ATS.1997.643906
ISSN: 1081-7735
eISSN: 2377-5386
Language: English
Date published: 1997
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198017602771

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