On the coverage of delay faults in scan designs with multiple scan chains

Conference proceeding

Irith Pomeranz and Sudhakar M Reddy

Proceedings, IEEE International Conference on Computer Design, pp.206-209

ICCD'2002 : IEEE international conference on computer design : VLSI in computers and processors (Freiburg, 16-18 September 2002)

2002

DOI: 10.1109/ICCD.2002.1106771

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Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Title: Subtitle: On the coverage of delay faults in scan designs with multiple scan chains
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: Proceedings, IEEE International Conference on Computer Design, pp.206-209
Conference: ICCD'2002 : IEEE international conference on computer design : VLSI in computers and processors (Freiburg, 16-18 September 2002)
DOI: 10.1109/ICCD.2002.1106771
ISSN: 1063-6404
eISSN: 2576-6996
Publisher: IEEE
Grant note: IEEE Circuits and Systems Society IEEE Computer Society; Technical Committee on Design Automation
Language: English
Date published: 2002
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984197553802771

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