Conference proceeding
On the fault coverage of delay fault detecting tests
Proceedings of the conference on european design automation, pp.334-338
EURO-DAC '90
03/12/1990
DOI: 10.1109/EDAC.1990.136669
Abstract
Existing methodologies for determining gate delay fault coverages are shown to have certain deficiencies. A new and more realistic delay model is presented with the ultimate goal of ensuring error-free circuit operation through obtaining true fault coverages that extend upto the actual slacks. Methods are given that achieve such coverages when possible. Results of experiments performed to evaluate the practical benefits of the proposed methods over previous approaches are given. The proposed method over previous approaches are given. The proposed method based on varying the sampling time of the circuit outputs during testing is seen to produce very high delay fault coverages upto the actual circuit slacks, as opposed to methods based on fixed output sampling times.
Details
- Title: Subtitle
- On the fault coverage of delay fault detecting tests
- Creators
- Ankan PramanickSudhakar Reddy
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of the conference on european design automation, pp.334-338
- Series
- EURO-DAC '90
- DOI
- 10.1109/EDAC.1990.136669
- Publisher
- IEEE Computer Society Press
- Language
- English
- Date published
- 03/12/1990
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197207002771
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