On the generation of compact test sets

Amit Kumar; Janusz Rajski; Sudhakar M Reddy; Chen Wang

doi:10.1109/TEST.2013.6651914

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Conference proceeding

On the generation of compact test sets

Amit Kumar, Janusz Rajski, Sudhakar M Reddy and Chen Wang

2013 IEEE International Test Conference (ITC), pp.1-10

09/2013

DOI: 10.1109/TEST.2013.6651914

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Abstract

New methods are proposed to guide line justification and fault propagation in test generation procedures to derive compact test sets. Experiments on several industrial designs yielded, on average, 24% reduction in test set sizes.

Automatic test pattern generation

Circuit faults

Compaction

Controllability

Logic gates

Observability

System-on-chip

Details

Title: Subtitle: On the generation of compact test sets
Creators: Amit Kumar - University of Iowa
Janusz Rajski - Mentor Graphics
Sudhakar M Reddy - University of Iowa
Chen Wang - Mentor Graphics
Resource Type: Conference proceeding
Publication Details: 2013 IEEE International Test Conference (ITC), pp.1-10
DOI: 10.1109/TEST.2013.6651914
ISSN: 1089-3539
eISSN: 2378-2250
Publisher: IEEE
Language: English
Date published: 09/2013
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984196965602771

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