Conference proceeding
On the saturation of n-detection test sets with increased n
2007 IEEE International Test Conference, pp.1-10
10/2007
DOI: 10.1109/TEST.2007.4437647
Abstract
An n-detection test set contains n different tests for each target fault. The value of n is typically determined based on test set size constraints, and certain values have become standard. In this work we investigate appropriate values for n by considering the saturation of the n-detection test generation process. As n is increased, eventually the rate of increase in test set quality starts dropping. Saturation occurs when the increase in test set quality with n drops below a certain level. We introduce three parameters of an n-detection test set to measure saturation of the test generation process: (1) the fraction of faults detected n times or less by the test set, (2) the fraction of faults detected fewer than n times by the test set, and (3) the test set size relative to the size of a one-detection test set. We demonstrate that the behavior of each one of these parameters follows a unique pattern as n is increased, and certain features of this behavior can be used to identify saturation. All the parameters are easy to compute during the test generation process.
Details
- Title: Subtitle
- On the saturation of n-detection test sets with increased n
- Creators
- Irith Pomeranz - Purdue University West LafayetteSudhakar M Reddy - University of Iowa
- Resource Type
- Conference proceeding
- Publication Details
- 2007 IEEE International Test Conference, pp.1-10
- DOI
- 10.1109/TEST.2007.4437647
- ISSN
- 1089-3539
- eISSN
- 2378-2250
- Publisher
- IEEE
- Language
- English
- Date published
- 10/2007
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197457502771
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