On undetectable faults in partial scan circuits using transparent-scan

Conference proceeding

Irith Pomeranz and Sudhakar M Reddy

IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings, pp.82-84

International Conference on Computer Design (ICCD) (San Jose, California, 10/11/2004–10/13/2004)

2004

DOI: 10.1109/ICCD.2004.1347904

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Applied Sciences

Integrated Circuits

Design. Technologies. Operation analysis. Testing

Electronics

Exact sciences and technology

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Testing, measurement, noise and reliability

Title: Subtitle: On undetectable faults in partial scan circuits using transparent-scan
Creators: Irith Pomeranz - Purdue University West Lafayette
Sudhakar M Reddy - University of Iowa
Resource Type: Conference proceeding
Publication Details: IEEE International Conference on Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings, pp.82-84
Conference: International Conference on Computer Design (ICCD) (San Jose, California, 10/11/2004–10/13/2004)
DOI: 10.1109/ICCD.2004.1347904
ISSN: 1063-6404
eISSN: 2576-6996
Publisher: IEEE Computer Society
Language: English
Date published: 2004
Academic Unit: Electrical and Computer Engineering
Record Identifier: 9984198001502771

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