Conference proceeding
Optical and x-ray alignment approaches for off-plane reflection gratings
Proceedings of SPIE - The International Society for Optical Engineering, Vol.9603, pp.960315-960315-11
09/04/2015
DOI: 10.1117/12.2186412
Abstract
Off-plane reflection gratings offer the potential for high-resolution, high-throughput X-ray spectroscopy on future missions. Typically, the gratings are placed in the path of a converging beam from an X-ray telescope. In the off-plane reflection grating case, these gratings must be co-aligned such that their diffracted spectra overlap at the focal plane. Misalignments degrade spectral resolution and effective area. In-situ X-ray alignment of a pair of off-plane reflection gratings in the path of a silicon pore optics module has been performed at the MPE PANTER beamline in Germany. However, in-situ X-ray alignment may not be feasible when assembling all of the gratings required for a satellite mission. In that event, optical methods must be developed to achieve spectral alignment. We have developed an alignment approach utilizing a Shack-Hartmann wavefront sensor and diffraction of an ultraviolet laser. We are fabricating the necessary hardware, and will be taking a prototype grating module to an X-ray beamline for performance testing following assembly and alignment.
Details
- Title: Subtitle
- Optical and x-ray alignment approaches for off-plane reflection gratings
- Creators
- Ryan Allured - Harvard UniversityBenjamin D Donovan - University of IowaCasey T DeRoo - University of IowaHannah R Marlowe - University of IowaRandall L McEntaffer - University of IowaJames H Tutt - University of IowaPeter N Cheimets - Harvard UniversityEdward Hertz - Harvard UniversityRandall K Smith - Harvard UniversityVadim Burwitz - Max Planck SocietyGisela Hartner - Max Planck SocietyBenedikt Menz - Max Planck Society
- Contributors
- Stephen L O'Dell (Editor) - NASA Marshall Space Flight Ctr. (United States)Giovanni Pareschi (Editor) - INAF - Osservatorio Astronomico di Brera (Italy)
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings of SPIE - The International Society for Optical Engineering, Vol.9603, pp.960315-960315-11
- Publisher
- SPIE
- DOI
- 10.1117/12.2186412
- ISSN
- 0277-786X
- eISSN
- 1996-756X
- Language
- English
- Date published
- 09/04/2015
- Academic Unit
- University College Courses; Physics and Astronomy
- Record Identifier
- 9984199741302771
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