Conference proceeding
PROPTEST: A property based test pattern generator for sequential circuits using test compaction
Proceedings - ACM IEEE Design Automation Conference, pp.653-659
01/01/1999
DOI: 10.1109/DAC.1999.782023
Abstract
We describe a property based test generation procedure that uses static compaction to generate test sequences that achieve high fault coverages at a low computational complexity. A class of test compaction procedures are proposed and used in the property based test generator. Experimental results indicate that these compaction procedures can be used to implement the proposed test generator to achieve high fault coverage with relatively smaller run times.
Details
- Title: Subtitle
- PROPTEST: A property based test pattern generator for sequential circuits using test compaction
- Creators
- Ruifeng GuoSudhakar M ReddyIrith Pomeranz
- Resource Type
- Conference proceeding
- Publication Details
- Proceedings - ACM IEEE Design Automation Conference, pp.653-659
- DOI
- 10.1109/DAC.1999.782023
- ISSN
- 0738-100X
- Language
- English
- Date published
- 01/01/1999
- Academic Unit
- Electrical and Computer Engineering
- Record Identifier
- 9984197919102771
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